#New microscopy under ambient achieves less than 10 nm spatial resolution on surface potential measurement
“#New microscopy under ambient achieves less than 10 nm spatial resolution on surface potential measurement” Credit: ACS A new nanomaterials microscopy approach called Pulsed Force Kelvin Probe Force Microscopy (PF-KPFM), allows for less than 10 nanometer measurements of work function and surface potential in a single-pass AFM scan. The findings have been published in two…